Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 23598

003 - CONTROL NUMBER IDENTIFIER

• control field: APU

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20140419111102.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 140419|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

• Original cataloging agency: APU
• Transcribing agency: APU

150 ## - HEADING--TOPICAL TERM

• Topical term or geographic name as entry element: Semiconductors
• General subdivision: Testing
• Form subdivision: Congresses.

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (APU)0: International Test Conference (1986 : Washington, D.C.) 23597, Testing's impact on design & technology :, c1986.