Meeting the tests of time : International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
Material type:
TextPublication details: Washington : IEEE Computer Society Press, c1989Description: xxxiv, 959 p. : ill. ; 29 cmISBN: 0818689625 (hbk.)Subject(s): Integrated circuits -- Testing -- Congresses | Automatic test equipment -- CongressesDDC classification: REF 620.0044 LOC classification: REF TK7874 | .I58 1989
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
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Reference
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APU Library Reference Collection | Conference Proceeding | REF TK7874 .I58 1989 c.1 (Browse shelf (Opens below)) | 1 | Not for loan (Restricted access) | 00023166 |
"IEEE catalog number 89CH2742-5"--T.p. verso.
Includes bibliographical references.
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