ICCAD-87 : IEEE International Conference on Computer-aided design : digest of technical papers : November 9-November 12, 1987, Convention Center, Santa Clara, California / sponsored by IEEE Computer Society, IEEE Circuits and Systems Society ; in cooperation with IEEE Electron Devices Society, ACM Special Interest Group on Design Automation.
Material type:
TextPublication details: Washington, D.C. : IEEE Computer Society Press, c1987Description: xxii, 545 p. : ill. ; 28 cmISBN: 0818608145 (pbk.)Subject(s): Integrated circuits -- Design and construction -- Data processing -- Congresses | Computer-aided design -- Congresses | Integrated circuits -- Congresses | Computers -- Congresses | Electronic circuit design -- CongressesDDC classification: REF 621.38173 LOC classification: REF TK7874 | .I34 1987
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|
Reference
|
APU Library Reference Collection | Conference Proceeding | REF TK7874 .I34 1987 c.1 (Browse shelf (Opens below)) | 1 | Missing Not for loan (Restricted access) | 00024030 |
Browsing APU Library shelves, Shelving location: Reference Collection, Collection: Conference Proceeding Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| REF TK7867 .I44 1989 c.1 Digest of technical papers : | REF TK7874 .I34 1985 c.1 ICCAD-85 : | REF TK7874 .I34 1986 c.1 ICCAD-86 : | REF TK7874 .I34 1987 c.1 ICCAD-87 : | REF TK7874 .I34 1988 c.1 ICCAD-88 : | REF TK7874 .I58 1986 c.1 Testing's impact on design & technology : | REF TK7874 .I58 1987 c.1 Integration of test with design and manufacturing : |
"IEEE catalog no. 87CM2469-5".
"IEEE Computer Society order number 814".
There are no comments on this title.