Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
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TextPublication details: Washington, D.C. : Los Angeles, CA : Computer Society Press of the IEEE ; Order from Computer Society of the IEEE, c1987Description: xxxi, 1151 p. : ill. ; 28 cmISBN: 081860798X (pbk.)Subject(s): Integrated circuits -- Testing -- Congresses | Electronic digital computers -- Circuits -- Testing -- Congresses | Automatic test equipment -- CongressesDDC classification: REF 621.38173 LOC classification: REF TK7874 | .I58 1987
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
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Reference
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APU Library Reference Collection | Conference Proceeding | REF TK7874 .I58 1987 c.1 (Browse shelf (Opens below)) | 1 | Not for loan (Restricted access) | 00024058 |
"IEEE catalog no. 87CH2347-2."
"Computer Society order no. 789."
Includes bibliographies and index.
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