TY  - BOOK
ED  - International Test Conference
ED  - IEEE Computer Society.
ED  - Institute of Electrical and Electronics Engineers.
TI  - Testing's impact on design & technology: International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 
SN  - 0818607262 (pbk.)
AV  - REF TK7874 .I58 1986
U1  - REF 621.38173 19
PY  - 1986///
CY  - Washington, D.C.
PB  - IEEE Computer Society Press
KW  - Integrated circuits
KW  - Testing
KW  - Congresses
KW  - Semiconductors
N1  - "IEEE catalog no. 86CH2339-0."; Includes bibliographies and index
ER  -