|
21.
|
Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 / sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section. by International Test Conference (1986 : Washington, D.C.) | IEEE Computer Society | Institute of Electrical and Electronics Engineers. Philadelphia Section. Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: Washington, D.C. : IEEE Computer Society Press, c1986Availability: Items available for reference: APU Library Not for loanCall number: REF TK7874 .I58 1986 c.1 (1). :
|
|
22.
|
|
|
23.
|
ICFCC 2009 : International Conference on Future Computer and Communications : proceedings, 3-5 April 2009, Kuala Lumpar [sic], Malaysia. by International Conference on Future Computer and Communications (2009 : Kuala Lumpur, Malaysia) | International Association of Computer Science and Information Technology | Singapore Institute of Electronics | IEEE Computer Society. Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: Los Alamitos, Calif. : IEEE Computer Society, c2009Other title: International Conference on Future Computer and Communications | Future Computer and Communications.Availability: Items available for reference: APU Library Not for loanCall number: REF TK5103.2 .I58 2009 c.1 (1). :
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