000			01232nam a2200289 a 4500
001			3362808
003			APU
005			20150826170903.0
008			861202s1986 dcua b 101 0 eng
010			_a 86228406
020			_a0818607262 (pbk.)
040			_aDLC _beng _cDLC _dSUE
050	0	0	_aREF TK7874 _b.I58 1986
082	0	0	_219 _aREF 621.38173 _bINT 1986
111	2		_aInternational Test Conference _d(1986 : _cWashington, D.C.) _923597
245	1	0	_aTesting's impact on design & technology : _bInternational Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 / _csponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
260			_aWashington, D.C. : _bIEEE Computer Society Press, _cc1986.
300			_axxx, 1009 p. : _bill. ; _c28 cm.
500			_a"IEEE catalog no. 86CH2339-0."
504			_aIncludes bibliographies and index.
650		0	_aIntegrated circuits _xTesting _vCongresses. _922854
650		0	_aSemiconductors _xTesting _vCongresses. _923598
710	2		_aIEEE Computer Society. _96594
710	2		_aInstitute of Electrical and Electronics Engineers. _bPhiladelphia Section. _923596
906			_a7 _bcbc _corignew _d2 _encip _f19 _gy-gencatlg
942			_2lcc _cConference Proceeding
999			_c12819 _d12819