Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
- Washington, D.C. : IEEE Computer Society Press, c1986.
- xxx, 1009 p. : ill. ; 28 cm.
"IEEE catalog no. 86CH2339-0."
Includes bibliographies and index.
0818607262 (pbk.)
86228406
Integrated circuits--Testing--Congresses.
Semiconductors--Testing--Congresses.
REF TK7874 / .I58 1986
REF 621.38173 / INT 1986
"IEEE catalog no. 86CH2339-0."
Includes bibliographies and index.
0818607262 (pbk.)
86228406
Integrated circuits--Testing--Congresses.
Semiconductors--Testing--Congresses.
REF TK7874 / .I58 1986
REF 621.38173 / INT 1986