Asia Pacific University Library catalogue


Testing's impact on design & technology : (Record no. 12819)

000 -LEADER
fixed length control field 01232nam a2200289 a 4500
001 - CONTROL NUMBER
control field 3362808
003 - CONTROL NUMBER IDENTIFIER
control field APU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20150826170903.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 861202s1986 dcua b 101 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 86228406
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0818607262 (pbk.)
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Language of cataloging eng
Transcribing agency DLC
Modifying agency SUE
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number REF TK7874
Item number .I58 1986
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Edition number 19
Classification number REF 621.38173
Item number INT 1986
111 2# - MAIN ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element International Test Conference
Date of meeting (1986 :
Location of meeting Washington, D.C.)
9 (RLIN) 23597
245 10 - TITLE STATEMENT
Title Testing's impact on design & technology :
Remainder of title International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
Statement of responsibility, etc sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Washington, D.C. :
Name of publisher, distributor, etc IEEE Computer Society Press,
Date of publication, distribution, etc c1986.
300 ## - PHYSICAL DESCRIPTION
Extent xxx, 1009 p. :
Other physical details ill. ;
Dimensions 28 cm.
500 ## - GENERAL NOTE
General note "IEEE catalog no. 86CH2339-0."
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographies and index.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Integrated circuits
General subdivision Testing
Form subdivision Congresses.
9 (RLIN) 22854
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Semiconductors
General subdivision Testing
Form subdivision Congresses.
9 (RLIN) 23598
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element IEEE Computer Society.
9 (RLIN) 6594
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element Institute of Electrical and Electronics Engineers.
Subordinate unit Philadelphia Section.
9 (RLIN) 23596
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c orignew
d 2
e ncip
f 19
g y-gencatlg
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type Conference Proceeding
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Use restrictions Not for loan Collection code Home library Current library Shelving location Date acquired Source of acquisition Invoice number Total Checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type
Not Withdrawn Available   Not Damaged Restricted access Not for loan Conference Proceeding APU Library APU Library Reference Collection 19/04/2014 DONATION MIMOS   REF TK7874 .I58 1986 c.1 00024051 28/06/2014 1 19/04/2014 Reference