Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 / sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
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TextPublication details: Washington, D.C. : IEEE Computer Society Press, c1986Description: xxx, 1009 p. : ill. ; 28 cmISBN: 0818607262 (pbk.)Subject(s): Integrated circuits -- Testing -- Congresses | Semiconductors -- Testing -- CongressesDDC classification: REF 621.38173 LOC classification: REF TK7874 | .I58 1986
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
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Reference
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APU Library Reference Collection | Conference Proceeding | REF TK7874 .I58 1986 c.1 (Browse shelf (Opens below)) | 1 | Not for loan (Restricted access) | 00024051 |
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| REF TK7874 .I34 1986 c.1 ICCAD-86 : | REF TK7874 .I34 1987 c.1 ICCAD-87 : | REF TK7874 .I34 1988 c.1 ICCAD-88 : | REF TK7874 .I58 1986 c.1 Testing's impact on design & technology : | REF TK7874 .I58 1987 c.1 Integration of test with design and manufacturing : | REF TK7874 .I58 1989 c.1 Meeting the tests of time : | REF U163 .P76 2007 c.1 Proceedings of the 6th European conference on information warfare and security : defense college of management and technology Shrivenham, United Kingdom 2-3 July 2007 / |
"IEEE catalog no. 86CH2339-0."
Includes bibliographies and index.
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